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    微波暗室反射率电平对微波场强校准的影响
    Influence of Reflectance Level at Calibrating Microwave Field Strength in Microwave Anechoic Chamber
      
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    中文摘要:
          论述了微波暗室静区反射率电平的测量方法和微波场强校准原理，分析了反射率电平对标准场法微波场强校准的影响。
    英文摘要:
          It discusses the method for measuring reflectance level and the principle for calibrating microwave field strength in the quiet zone of microwave anechoic chamber,and analyes the influence of reflectance level at calibrating microwave field strength using the method of standard field.
    朱传焕
    中国船舶重工集团公司第七0一研究所,湖北武汉430064
    中文关键词:  微波暗室  反射率电平  场强  校准
    英文关键词:microwave anechoic chamber  reflectance level  field strength  calibrate  
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