Guide for authors
Metrology & Measurement Technology is an open access journal. Readers are allowed to read, download, copy, distribute, print, search, or link to the full texts of the articles free, or use them for other lawful purposes. This is in accordance with the DOAJ definition of open access.
Metrology & Measurement Technology is a double-anonymous peer-reviewed journal. The accepted manuscripts for publications are charged a certain page of publication fee, and remuneration will be paid.
Scope of solicitation
1. The top ten metrology and measurement subjects. 2. Reviews of the development trend and hot topics of metrology and measurement technology. 3. Developments and applications of primary standards and standards of measurement. 4. New theoretical research, applications of new technologies and introductions of new methods in metrology, testing, measurement, calibration and verification. Such theories, technologies and methods include but are not limited to: testability, femtosecond laser measurement, dynamic testing and calibration, laser measurement, automatic testing and calibration, real-time data processing, comprehensive calibration of multi-parameter systems, calibration and traceability of the special test equipment, electronic measurement and calibration, large size and long-distance measurement, (aero) engine testing; tracking measurement, on-site and on-line measurement, and automatic and intelligent detection. 5. Design, development and calibration (verification) of testing instruments, sensors, testing systems, calibration devices, test stands, testers, etc. 6. Discussions on measurement management mode and method; Comments on new standards and regulations at home and abroad; Discussion on issues in the implementation of national metrological verification regulations and calibration specifications. 7. Applications of various new technologies such as laser, infrared, nano,optical fiber sensing and quantum in the fields of metrology, testing, measurement and control. 8. Cross-disciplinary or interdisciplinary issues, whose contents are related to metrology and measurement, or whose theory, technology, equipment and materials are expected to solve the existing major technical challenges in the metrology and measurement field.
Main columns
With the development of metrology and measurement technology and the increasing demand of readers who are engaged in the research, development, teaching, production, application, operation and management of metrology and measurement technology, the column setting of this journal is constantly enriched and improved. After decades of practice, this journal has gradually set up more than ten columns, such as "Reviews", "Theory and method", "Metrology, measurement and calibration", "New technology and instrument", "Measurement informatization and management". We are also prepared to add some new columns in a timely and appropriate manner as needed, and truly make the journal an important media for academic discussion, technical exchange and experience introduction.
The followings are the introductions to the main columns of this journal.
Reviews: publish the development history and forecast, special discussion and summary of hot issues of measurement and testing technology. Among them, the contents of special discussion and summary of hot issues cover the introduction and comments of new standards and regulations at home and abroad; Comments on major technical and management initiatives, events with significant impacts or controversial issues that have aroused widespread concern in the measurement community at home and abroad.
New technology and instrument: publish the research and application examples of various new measurement, testing and calibration technologies; Design, development and application of new standard device, test system calibration device, test bench and tester. Design, development and application of testing instruments, sensors, digital, intelligent and virtual instruments, etc.
Theory and method: publish papers with strong theoretical and research nature. Inter- or cross-disciplinary issues can also be published in this column, but their contents should be related to metrology and measurement or their theories, technologies, materials and equipment are expected to solve the existing major technical difficulties in metrology and measurement field.
Metrology, measurement and calibration: publish the introduction of new methods of metrology, measurement, calibration and verification; discussion on maintenance, verification and repair methods of measurement instruments, sensors, etc.
Submission method
Please authors submit their articles online! The website is http://www.jicejishu.net. Please register first. When registering, please fill in the detailed information: ID number, telephone, mobile phone, e-mail, detailed mailing address, education background, professional title, and specific research direction. Students, please also register their tutor's information. Please be sure to sign and upload the "copyright transfer agreement" when submitting the manuscripts; Authors can also recommend 1 to3 referees as reviewers (these referees may be reviewers of your article, especially in some new research fields or interdisciplinary subjects). |