Editorial Board of Metrology & Measurement Technology

(Sort by surname stroke)

Chairman：

Zhang Bo, Changcheng Institute of Metrology & Measurement

Vice chairman：

Chen Gang, Science and Information Technology Department of China Aviation Industry Group Corporation

Duan Yuning, Chinese Academy of Metrology

Hu Xiaoyu, China Aviation Development Commercial Aviation Engine Co. Ltd

Executive deputy director：

Yang Yongjun, Changcheng Institute of Metrology & Measurement

Specially invited committee members：

Academician Wang Liding, School of Mechanical Engineering Dalian University of Technology

Academician Yin Zeyong, China Aviation Development Corporation

Academician Ye Shenghua, Department of Precision Instruments Tianjin University

Academician Li Tianchu, Chinese Academy of Metrology

Academician Li Detian, Lanzhou Institute of Space Technology Physics

Academician Zhang Guangjun, Ministry of Science and Technology of the People's Republic of China

Academician Zhang Zhonghua, Chinese Academy of Metrology

Academician Zhang Yanzhong, China Aviation Industry Group Corporation

Academician Yu Hongru, Institute of Mechanics Chinese Academy of Sciences

Academician Tan Jiubin, Harbin Institute of Technology

Editorial committee member：

Yu Liandong, China University of Petroleum (East China)

Ma Aiwen, Chinese Society of Metrology and Testing

Wang Hengfei, 41st Research Institute of China Electronics Technology Group Corporation

Wang Xiaodong, Dalian University of Technology

Wang Xiaodong, China Metrology Association

Wang Xiaowei, Henan Institute of Metrology

Shi Xiaojiang, China Gas Turbine Research Institute

Shi Zhaoyao, Beijing University of Technology

Fu Yuegang, Changchun University of Technology

Bai Jian, Zhejiang University

Feng Jijun, Shanghai University of Technology

Feng Qibo, Beijing Jiaotong University

Zhu Zhenyu, Changcheng Institute of Metrology & Measurement

Wu Fan, Chinese Academy of Sciences Chengdu Institute of Optoelectronics

Liu Min, China Aerospace Science and Industry Group Fifth Institute

Liu Jian, Harbin Institute of Technology

Liu Yuandong, Shandong Nonmetallic Materials Research Institute

Liu Guixiong, South China University of Technology

Xu Hang, Fujian Institute of Metrology

Li Yulong, Northwestern Polytechnical University

Li Mingzhao, Shenzhen Institute of Metrology and Quality Testing

Li Xuejin, Shenzhen University

Li Runbing, Institute of Precision Measurement Science and Technology Innovation Chinese Academy of Sciences

Yang Lianxiang, University of Auckland USA

Yang Chuntao, China Aerospace Science and Industry Group Second Institute

Di Chang'an, Nanjing University of Technology

Zhang Li, Changcheng Institute of Metrology & Measurement

Zhang Shulian, Tsinghua University

Zhang Yan, National University of Defense Science and Technology

Zhang Zhijie, Central North University

Zhang Baozhen, Aviation Development Center

Zhang Zonghua, Hebei University of Technology

Zhang Gao, Xi'an Institute of Modern Chemistry

Chen Xing, Tianjin Institute of Metrology Supervision and Testing Science

Chen Weimin, Chongqing University

Chen Qingsong, Institute 704 of the 9th Institute of Aerospace Science and Technology Group

Shao Li, Shanghai Institute of Metrology and Testing Technology

Lin Min, China Institute of Atomic Energy

Lin Qiang, Zhejiang University of Technology

Zhou Xiaoji, Peking University

Zhou Ning, Changcheng Institute of Metrology & Measurement

Zhou Zili, Aviation Industry Group Co. Ltd

Zhou Weihu, Institute of Optoelectronics Chinese Academy of Sciences

Zhao Hui, Shanghai Jiao Tong University

Hao Qun, Beijing University of Technology

Hu Xiaodong, Tianjin University

Zhong Zhiping, University of Chinese Academy of Sciences

Yu Bing, Xi'an Institute of Applied Optics

Yao Hejun, Beijing Institute of Metrology and Testing Science

Xia Haojie, Hefei University of Technology

Xu Guili, Nanjing University of Aeronautics and Astronautics

Qi Ningwu, Chongqing Metrology Quality Testing Research Institute

Zeng Heping, East China Normal University

Cheng Sheng, China Commercial Aircraft Co. Ltd

Cai Xiaobin, Science and Technology Research Department of the Science and Technology Committee of China Aviation Industry Group Corporation

Liao Li, Changcheng Institute of Metrology & Measurement

Kan Jinsong, Institute of Electronic Industry, Standardization Ministry of Industry and Information Technology

Fan Shangchu,n Beijing University of Aeronautics and Astronautics

Dai Gaoliang, Federal Institute of Physical Technology Germany

Wei Zhiyi, Institute of Physics, Chinese Academy of Sciences

Wei Zhenzhong, Beijing University of Aeronautics and Astronautics

Youth commissar：

Wang Ping, Nanjing University of Aeronautics and Astronautics

Wang Yu, Changcheng Institute of Metrology & Measurement

Yin Yugang, Beijing Telemetry Technology Research Institute

Shi Junkai, Institute of Microelectronics, Chinese Academy of Sciences

Fu Yuxi, Xi'an Institute of Optics and Precision Machinery, Chinese Academy of Sciences

Feng Yanying, Tsinghua University

Quan Wei, Beijing University of Aeronautics and Astronautics

Zhuang Wei, China Institute of Metrology

Liu Chong, China Electronics Standardization Institute

Liu Zhiying, Changchun University of Science and Technology

Yan Ming, East China Normal University

Sun Junhua, Beijing University of Aeronautics and Astronautics

Li Wei, Changcheng Institute of Metrology & Measurement

Li Bo, Tianjin University

Li Ruijun, Hefei University of Technology

Yang Jun, Changcheng Institute of Metrology & Measurement

Wu Guanhao, Tsinghua University

Wu Yahui, Changcheng Institute of Metrology & Measurement

He Xiaomei, Changcheng Institute of Metrology & Measurement

Zhang Dazhi, Changcheng Institute of Metrology & Measurement

Zhang Jun, Hangzhou Institute of Applied Acoustics

Zhang Jin, Hefei University of Technology

Wu Tengfei, Changcheng Institute of Metrology & Measurement

Fan Fei, Nankai University

Lin Hui, Shanghai University of Technology

Luo Zai, China University of Metrology

Zhou Hailiang, Tianjin Institute of Metrological Supervision and Testing Science

Zheng Dezhi, Beijing University of Aeronautics and Astronautics

Qu Yufu, Beijing University of Aeronautics and Astronautics

Qu Jifeng, Chinese Academy of Metrology

Qu Xiaolei, Beijing University of Aeronautics and Astronautics

Meng Tao, Chinese Academy of Metrology

Zhao Libin, Hebei University of Technology

Zhao Xin, Beijing University of Aeronautics and Astronautics

Hu Xiaomei, Shanghai University

Hu Chunguang, Tianjin University

Hu Yao, Beijing University of Technology

Hu Yuan, Changchun University of Science and Technology

Lou Zhifeng, Dalian University of Technology

He Wenjun, Changchun University of Technology

Jia Junwei, Beijing Oriental Institute of Metrology and Testing, China Academy of Space Technology

Xia Haiyun, Nanjing information engineering University

Gaorongke, China University of Petroleum (East China)

Guo Yazhou, Northwestern Polytechnical University

Tan Yidong, Tsinghua University

Cao Shiying, Chinese Academy of Metrology

Fu Tairan, Tsinghua University

Liang Sheng, Beijing Jiaotong University

Peng Chunrong, Institute of Electronics Chinese Academy of Sciences

He Mingzhao, China Institute of Metrology

Cai Chenguang, China Institute of Metrology

Cai Jing, Changcheng Institute of Metrology & Measurement

Lin Yuting, Beijing Satellite Navigation Center

Zhai Zhongsheng, Hubei University of Technology