Quantum metrology is a technology to enhance the accuracy and sensitivity of parameter estimation by using quantum superposition and entanglement, quantum interaction process and quantum measurement. It is one of the most promising quantum technologies in the short and medium term. Starting from the optimization research scheme of quantum metrology, we analyze three optimization schemes of quantum metrology by combing and summarizing related literatures, which are categorized into: quantum state preparation and measurement, the control of quantum evolution process and the classical post?processing optimization. The latest theoretical and experimental progresses of quantum metrology are introduced. Finally, the problems and challenges of quantum metrology are summarized, and the further work is prospected.