The Application of Photoelectric Microscope to Measuring Aperture
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TH741.1 TH74

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    Abstract:

    Measurement of non contact alignment with static photoelectric microscope improves the precision of aim and offers the reliable base of automeasurement.Combining with the alignment principle of the photoelectric microscope and establishing the mathematic model,the diameter of the inside pore can be measured.

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  • Received:
  • Revised:September 24,2002
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