Computer Program Design of Calibrating Film System of Thin Film
DOI:
CSTR:
Author:
Affiliation:

Clc Number:

O484.8 TB43

Fund Project:

  • Article
  • |
  • Figures
  • |
  • Metrics
  • |
  • Reference
  • |
  • Related
  • |
  • Cited by
  • |
  • Materials
  • |
  • Comments
    Abstract:

    The optical admittance of a single-layer film is derived from the characteristic matrix ofthe film pile. Based on the single- layer,recurring layer by layer,supercomposing one by one,deriving theequivalent admittance of the film pile and calculating the reflect coefficient of the amplitude, thereflectivity and transmissivity of hte whole film system is derived at last.

    Reference
    Related
    Cited by
Get Citation
Related Videos

Share
Article Metrics
  • Abstract:
  • PDF:
  • HTML:
  • Cited by:
History
  • Received:
  • Revised:
  • Adopted:
  • Online:
  • Published:
Article QR Code