多类非漫反射表面结构光三维测量系统校准方法研究
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1.北京航空航天大学人工智能研究院;2.北京航空航天大学仪器科学与光电工程学院

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TB9

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航天科技创新基金(CE821004)


Research on Calibration Methods for Structured Light 3D Measurement Systems on Multiple Types of Non-Diffuse Reflective Surfaces
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1.Institute of Artificial Intelligence,Beihang University,Beijing;2.School of Instrumentation Science and Optoelectronic Engineering,Beihang University,Beijing

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    摘要:

    结构光三维测量系统作为工业领域内获取被测表面三维形貌的重要测量工具,其测量精度由标准器、校准原理及校准方法共同决定。但面向高端工业制造领域中越来越常见的复杂光学特性表面,例如半透明表面、高反光表面、高动态范围反射率表面时,国内外现行的计量标准如VDI/VDE 2634 - Optical 3D Measuring Systems、JJF1951-2021 基于结构光扫描的光学三维测量系统校准规范等只针对漫反射标准器及漫反射表面进行了规定,已不满足实际校准需求。因此,针对结构光三维测量系统工业复杂应用场景,从光学特性角度定义了半透明表面、高反光表面以及高动态范围反射率表面,设计不同表面适用的标准器,进而根据校准需求完善校准原理并给出了校准方法,实现了结构光三维测量系统对多类被测表面的曲面、平面、距离等关键几何参数测量的校准,是现行结构光三维测量系统校准标准的补充以及完善,为推动工业制造领域向精密化、自动化、标准化方向发展起到了重要的作用。

    Abstract:

    As a crucial measurement tool for acquiring the 3D topography of measured surfaces in the industrial field, the measurement accuracy of structured light 3D measurement systems is jointly determined by standard standards, calibration principles, and calibration methods. However, for complex optical characteristic surfaces that are increasingly common in the field of high-end industrial manufacturing, such as translucent surfaces, high-reflective surfaces, and high-dynamic range reflectivity surfaces, current domestic and international metrological standards (e.g., VDI/VDE 2634 - Optical 3D Measuring Systems, and JJF 1951-2021 Calibration Specification for Optical 3D Measurement Systems Based on Structured Light Scanning) only specify requirements for diffuse reflection standards and diffuse reflection surfaces, which can no longer meet the actual calibration needs. Therefore, targeting the complex industrial application scenarios of structured light 3D measurement systems, this study defines translucent surfaces, highly reflective surfaces, and surfaces with high dynamic range reflectivity from the perspective of optical properties, designs standard standards suitable for different surfaces, further improves calibration principles according to calibration requirements, and proposes corresponding calibration methods. This enables the calibration of key geometric parameters (e.g., curved surfaces, flat surfaces, and distances) measured by structured light 3D measurement systems for multiple types of measured surfaces. It serves as a supplement and improvement to the existing calibration standards for structured light 3D measurement systems, and plays an important role in promoting the development of the industrial manufacturing field toward precision, automation, and standardization.

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  • 收稿日期:2025-11-19
  • 最后修改日期:2025-12-10
  • 录用日期:2025-12-19
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