This paper introduces the advantages of white light interferometry, including non-contact operation, high precision, and strong adaptability. However, in practical measurements, interference signals are affected by light source instability, scanning nonlinearity, and environmental disturbances, leading to a significant increase in phase noise. The recent progress in the analysis and suppression of phase noise in white light interference signals is reviewed. Particular attention is given to a series of studies carried out by our research group, including the establishment of a multi-source noise analysis framework that incorporates random perturbations, dispersion errors, and vibrations, as well as noise suppression strategies. Finally, future research directions are discussed, emphasizing the need for deeper investigations into the formation mechanisms of phase noise, phase response characteristics, and coupling with system parameters. Multi-source noise modeling, adaptive optimization, and deep learning techniques can be applied to the analysis and suppression of phase noise in white-light interference signals, thereby advancing precision measurement technologies.