This paper introduces the fundamental working principles of scanning tunneling microscope (STM), addresses how it comprehensively fulfills the three core requirements of atomic-scale manufacturing —— "visualization", "precision measurement" and "fabrication feasibility"， and examines its pivotal role in revealing quantum phenomena and constructing artificial atomic structures. Studies highlight that STM's environmental adaptability, ultra-high spatial resolution, and ultra-high temporal resolution provide key experimental evidence for revealing novel mechanisms and effects in atomically precise manufacturing. STM, based on the unique quantum tunneling effect, performs precise measurements of physical properties (e.g., electronic and magnetic) in fabricated structures, and establishes quantitative structure-property relationships between fabrication parameters and device performance, thereby providing a critical basis for process optimization and quality assessment. The deep integration of STM atomic-scale manipulation capabilities with automated and high-throughput modules represents a critical strategy for breaking-through its efficiency bottleneck and propelling it into industrial applications. This technological convergence will propel atomic manufacturing from the precise fabrication of individual structures to the efficient and controllable manufacturing of complex functional devices. Future research needs to focus on developing in-situ STM measurement techniques that can simultaneously achieve femtosecond-level temporal resolution and sub-angstrom spatial resolution, as well as expanding the comprehensive physical property characterization capabilities of STM systems under complex multi-physical field coupling conditions, so as to provide technical support for the development of next-generation quantum materials and information devices.