Aiming at objectives, requirements, and basic problems in measurements and comparison under different conditions, the characteristics were systematically analyzed and discussed. At the same time, the characteristics of modeling measurements were also analyzed and discussed in detail. A standardized processing scheme is proposed especially for the problems that still exist, such as when the measurement condition, the measurement system and the measurement parameter change, the obtained waveform data of the same measured object has obvious difference. By using several simple combined model methods, the offset, translation, amplitude normalization, and then the modeling method of modeling and characterization, this paper has unified processing of the standardized characterization of waveform measurement results.