基于电光强度相位级联调制的激光扫频干涉测距方法
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Frequency scanning interferometry method for distance measurement based on electro⁃optical intensity⁃phase cascade modulation
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    摘要:

    激光扫频干涉(Frequency Scanning Interferometry, FSI)绝对测距技术在高端装备制造和空天科技领域展现出广阔的应用前景和重要的技术潜力。针对传统FSI在高动态测量场景下测距误差显著增大的问题,提出了一种基于电光强度?相位级联调制的FSI测距方法。在对传统FSI系统中光程差变化放大效应进行理论推导的基础上,设计了一种电光强度?相位级联调制的双边带FSI测距系统。该系统通过单光电探测器对扫频干涉光进行光电检测,并采用全相位快速傅里叶变换(All?Phase Fast Fourier Transform, APFFT)高精度提取干涉信号的相位信息,实现了对待测目标绝对距离和相对位移的同步高精度测量。仿真结果表明:该方法的绝对距离测量标准差在10 μm以下,相对位移测量标准差在10 nm以下,有效验证了所提方法的可行性和准确性。

    Abstract:

    Frequency Scanning Interferometry (FSI) absolute distance measurement technology exhibits significant potential for applications in advanced manufacturing and aerospace technology. To address the issue of significant measurement errors in traditional FSI systems under high?dynamic conditions, this paper proposes an FSI distance measurement method based on electro?optical intensity?phase cascade modulation. Based on the theoretical derivation of the amplification effect of optical path difference variation in traditional FSI systems, a double?sideband FSI distance measurement system with electro?optical intensity?phase cascade modulation was designed. The system employs a single photodetector for photoelectric detection of the frequency?scanning interference signal, and uses all?phase fast Fourier transform (APFFT) to extract the phase information of the interference signal with high precision, enabling the simultaneous high?accuracy measurement of both absolute distance and relative displacement of the target. Simulation results show that the standard deviation of the absolute distance measurement of this method can reach below 10 μm, and the standard deviation of the relative displacement measurement can reach below 10 nm, which effectively verifies the feasibility and accuracy of the proposed method.

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邓忠文, 刘传锋, 张恒康, 孙海峰, 张树威, 李小平.基于电光强度相位级联调制的激光扫频干涉测距方法[J].计测技术,2025,45(2):68~79:
10.11823/j. issn.1674-5795.2025.02.07.

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  • 在线发布日期: 2025-04-30
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